Pallet systems
With pallets, parts can be fixed before measurement, away from the machine, increasing productivity.
Pallets and clamping pallets
With ZEISS pallet systems, measuring device throughput can be significantly increased: while the device is measuring, the next workpiece is positioned on another pallet. The pallet can be exchanged in seconds and aligned for measurement without repositioning the part. Grid plates are also available for safe mounting of workpieces on the coordinate measuring machine.
Pallet categories
Optical
The ZEISS OMEGA pallet system is designed for ZEISS O-INSPECT, O-DETECT and O-SELECT optical measuring instruments.
Tactile
The ZEISS THETA pallet system can be used for tactile gantries and production measuring devices.
Tomografic
The ZEISS GAMMA pallet system is used to clamp components in ZEISS METROTOM or VoluMax computed tomography systems.